Fluctuation electron microscopy explained

Fluctuation electron microscopy (FEM), originally called Variable Coherence Microscopy before decoherence effects in the sample rendered that naming moot, is a technique in electron microscopy that probes nanometer-scale or "medium-range" order in disordered materials. The first studies were performed on amorphous Si (Treacy and Gibson 1997)^[1] and later on hydrogenated amorphous silicon.^[2]

Notes and References

1. Treacy, Gibson. Diminished medium-range order observed in annealed amorphous germanium. Physical Review Letters. 1997. 78. 1074. 10.1103/PhysRevLett.78.1074.
2. P. M. Voyles. J. E. Gerbi. M. M. J. Treacy. J. M. Gibson. J. R. Abelson. amp. Absence of an abrupt phase change from polycrystalline to amorphous in silicon with deposition temperature. Physical Review Letters. 2001. 86. 5514. 10.1103/PhysRevLett.86.5514.