Malter effect explained

The Malter effect is named after Louis Malter, who first described the effect. Following exposure to ionizing radiation (e.g., electrons, ions, X-rays, extreme ultraviolet, vacuum ultraviolet), secondary electron emission from the surface of a thin insulating layer results in the establishment of a positive charge on the surface. This positive charge produces a high electric field in the insulator, resulting in the emission of electrons through the surface. This tends to pull more electrons from further beneath the surface. Eventually the sample replenishes the lost electrons, by picking up the collected secondary electrons through the ground loop.[1] [2]

The Malter effect[3] [4] [5] often arises in wire chambers (aka drift chambers). After six years of operation, the BES III science team reported on a serious problem caused by the effect and how they coped with the problem.[6]

References

  1. Book: Peter W. Hawkes. Advances in electronics and electron physics. 10 March 2012. 1992. Academic Press. 978-0-12-014725-0. 34–.
  2. Book: American Institute of Electrical Engineers. Institute of Electrical and Electronics Engineers. Radio engineering and electronic physics. 10 March 2012. July 1980. American Institute of Electrical Engineers.
  3. Book: Particle Detectors: Fundamentals and Applications. 251. 978-0-19-189923-2. Kolanoski, Hermann. Wermes, Norbert. 30 June 2020. Oxford University Press.
  4. Book: Ballentyne, D. W. G.. Lovett, D. R.. 4th. Malter Effect. https://books.google.com/books?id=JL99CAAAQBAJ&pg=PT208. 9789401160285. A Dictionary of Named Effects and Laws in Chemistry, Physics and Mathematics. 6 December 2012. Springer.
  5. Book: Nappi, Eugenio. Sequinot, Jacques. Radiation Damage and Long Term Ageing in Gas Detectors by M. Titov. 199–226. https://books.google.com/books?id=WQzJCgAAQBAJ&pg=PA202. 9789814483322. Innovative Detectors for Supercolliders, Proceedings of the 42nd Workshop of the Infn Eloisatron Project. 10 August 2004. World Scientific. (See p. 202.)
  6. 17 Aug 2015. Aging effect in the BESIII drift chamber. Dong, M.Y.. Xiu, Q.L.. Wu, L.H.. Wu, Z.. Qin, Z.H.. Shen, P.. An, F.F.. Ju, X.D.. Liu, Y.. Zhu, K.. Ouyang, Q.. Chen, Y.B.. Chinese Physics C. 40. 016001. 10.1088/1674-1137/40/1/016001. 1504.04681. 118327562.

Bibliography

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