Hideo Fujiwara Explained

Hideo Fujiwara
Native Name:	藤原 秀雄
Birth Date:	9 February 1946
Birth Place:	Nara, Japan
Work Institution:	Osaka University, Meiji University, Nara Institute of Science and Technology (NAIST), Osaka Gakuin University
Alma Mater:	Osaka University^[1]
Known For:	FAN algorithm^[2]
Prizes:	IEEE Life Fellow^[3] IEEE Computer Society Golden Core Member Award^[4] IEICE Fellow^[5] IPSJ Fellow^[6] IEEE TTTC Lifetime Contribution Medal^[7] IEEE TTTC Outstanding Contribution Awards^[8]

is a Japanese computer scientist who made significant contributions to ATPG (automatic test pattern generation) algorithms. As one of his works, he invented the FAN algorithm in 1983, which was the fastest ATPG algorithm at that time, and was adopted by industry.^[9]

He was born in Nara, Japan, and studied electronic engineering at Osaka University, where he received his B.E. degree in 1969, M.E. in 1971, and Ph.D. in 1974. He was with Osaka University from 1974 to 1985, Meiji University from 1985 to 1993, Nara Institute of Science and Technology (NAIST) from 1993 to 2011, and Osaka Gakuin University from 2011 to 2021. Presently, he is Professor Emeritus of NAIST.

Notes and References

1. Web site: Personal History, Hideo Fujiwara . 28 October 2022 .
2. Fujiwara . Hideo . Shimono . Takeshi . On the acceleration of test generation algorithm . 10.1109/TC.1983.1676174 . IEEE Transactions on Computers . C-32 . 12 . 1137–1144 . December 1983.
3. Web site: IEEE Fellows Directory. 16 June 2022.
4. Web site: Golden Core Recognition, IEEE Computer Society. 16 June 2022.
5. Web site: Fellow, IEICE the Institute of Electronics, Information and Communication Engineers. 16 June 2022.
6. Web site: Fellow-Information Processing Society of Japan. 16 August 2023.
7. Web site: IEEE TTTC Lifetime Contribution Medal. IEEE TTTC. 16 June 2022. https://web.archive.org/web/20220121180634/http://www.ieee-tttc.org/?page_id=53065 . 21 January 2022.
8. Web site: TTTC Outstanding Contribution Awards (OC) - IEEE TTTC. IEEE TTTC. 16 August 2023.
9. Book: Abramovici . Miron . Melvin A. . Breuer . Arthur D. . Friedman . Digital Systems Testing and Testable Design . IEEE Press . 1990 . 9780780310629.